Accession Number : AD0743485

Title :   Diffusion in the Lead Chalcogenides.

Descriptive Note : Technical rept.,

Corporate Author : MASSACHUSETTS INST OF TECH CAMBRIDGE CENTER FOR MATERIALS SCIENCE AND ENGINEERING

Personal Author(s) : Walpole,James N. ; Guldi,Richard L.

Report Date : MAY 1972

Pagination or Media Count : 32

Abstract : The dependence on the deviation from stoichiometry of the diffusion coefficients describing interdiffusion (junction diffusion) and self-diffusion (radioactive tracer diffusion) of the constitutent atoms of the lead chalcogenides is obtained for the general case in which diffusion may occur through interstitials, vacancies, and divacancies simultaneously. This model indicates the appropriate experimental conditions for obtaining diffusion data of the two types and provides an explicit framework for interpretation of results and identification of the diffusion mechanisms. It is shown that the parameters characterizing the interdiffusion process may be evaluated independently by an appropriate combination of self-diffusion measurements. Comparisons of this type are made with existing data. (Author)

Descriptors :   (*SEMICONDUCTORS, DIFFUSION), LEAD COMPOUNDS, SULFIDES, TELLURIDES, SELENIDES, CRYSTAL DEFECTS

Subject Categories : Solid State Physics

Distribution Statement : APPROVED FOR PUBLIC RELEASE