Accession Number : AD0744076

Title :   X-Ray Topographic Observations of Slip Distributions in Alpha Silicon Carbide.

Descriptive Note : Physical sciences research papers,

Corporate Author : AIR FORCE CAMBRIDGE RESEARCH LABS L G HANSCOM FIELD MASS

Personal Author(s) : Posen,Harold ; Bruce,Jane A.

Report Date : 30 MAR 1972

Pagination or Media Count : 21

Abstract : An x-ray topographic study is made of three hexagonal SiC crystals, type 6H, of different national origin. All three crystals exhibit a high density of dislocations, many originating at the nucleation edge of the crystal and fanning out to the crystal boundaries. Burgers vectors were identified. Slip in the (1,1,-2,0) direction, characteristic of hexagonal materials, was observed. (Author)

Descriptors :   (*SILICON CARBIDES, X RAY DIFFRACTION), SINGLE CRYSTALS, DISLOCATIONS, DEFECTS(MATERIALS)

Subject Categories : Crystallography

Distribution Statement : APPROVED FOR PUBLIC RELEASE