Accession Number : AD0744076
Title : X-Ray Topographic Observations of Slip Distributions in Alpha Silicon Carbide.
Descriptive Note : Physical sciences research papers,
Corporate Author : AIR FORCE CAMBRIDGE RESEARCH LABS L G HANSCOM FIELD MASS
Personal Author(s) : Posen,Harold ; Bruce,Jane A.
Report Date : 30 MAR 1972
Pagination or Media Count : 21
Abstract : An x-ray topographic study is made of three hexagonal SiC crystals, type 6H, of different national origin. All three crystals exhibit a high density of dislocations, many originating at the nucleation edge of the crystal and fanning out to the crystal boundaries. Burgers vectors were identified. Slip in the (1,1,-2,0) direction, characteristic of hexagonal materials, was observed. (Author)
Descriptors : (*SILICON CARBIDES, X RAY DIFFRACTION), SINGLE CRYSTALS, DISLOCATIONS, DEFECTS(MATERIALS)
Subject Categories : Crystallography
Distribution Statement : APPROVED FOR PUBLIC RELEASE