Accession Number : AD0746368

Title :   Anomalous Behavior of MIPS(Metal Insulator Piezoelectric Semiconductor) Thin-Film Transducers,

Corporate Author : SASKATCHEWAN UNIV SASKATOON DEPT OF ELECTRICAL ENGINEERING

Personal Author(s) : Dey,S. K. ; Singh,F. B.

Report Date : 28 JUL 1971

Pagination or Media Count : 5

Abstract : An anomalous behavior similar to that reported by Muller and other workers has been observed in CdSe (MIPS) transducers containing an overwhelming hexagonal phase with c axis normal to the substrate. The negative response in drain current for positive strain values is found to be time-dependent and is determined mainly by the mode of operation of the device and its relaxation time in relation to the frequency of the applied stress. For all depletion devices studied, there exists a critical gate voltage V'(g) below which the transient response due to a positive strain is positive and above negative. The magnitudes of these two opposite effects are found to increase monotonically with the deviations from V'(g). The results are illustrated and explained in terms of surface states and trapping mechanism. The experimental time constant of a decay curve under a step-gate voltage is in agreement with the value calculated from theory. (Author)

Descriptors :   (*CADMIUM SELENIDES, PIEZOELECTRIC EFFECT), (*PIEZOELECTRIC TRANSDUCERS, SEMICONDUCTING FILMS), ELECTRICAL PROPERTIES, TRANSIENTS, CANADA

Subject Categories : Test Facilities, Equipment and Methods
      Solid State Physics

Distribution Statement : APPROVED FOR PUBLIC RELEASE