Accession Number : AD0753920

Title :   Computer Programs for Reduction of X-Ray Diffraction Data for Oriented Polycrystalline Specimens.

Descriptive Note : Technical rept.,

Corporate Author : ARMY MATERIALS AND MECHANICS RESEARCH CENTER WATERTOWN MASS

Personal Author(s) : Desper,C. Richard

Report Date : NOV 1972

Pagination or Media Count : 65

Abstract : AND BIAXSC, which processes biaxial orientation data. Data correnctions include background, Compton scattering, absorption, polarization, and balanced filter corrections. The processed data may be plotted on a Calcomp plotter, or, in some instances, directly on a line printer. A subroutine is available for fitting as amy as eight overlapping Gauss or Cauchy function peaks to a set of radial or uniaxial can data. Similarly, orientation measurements may be corrected for overlap of different diffraction peaks. THE PROGRAMS ALSO WILL CALCULATE VARIOUS MOMENTS OF THE INTENSITY DISTRIBUTION FOR ORIENTED SAMPLES TO AID IN INVERSION OF POLE FIGURES. In addition, partial pole figures obtained in reflection and transmission may be merged. The programs are written to accept data generated by a specific set of PDP-8 programs used with the Picker FACS-1 automated system. Input statements have been isolated, however, to facilitate changes in the input data format. (Author)

Descriptors :   (*X RAY DIFFRACTION, *COMPUTER PROGRAMMING), (*CRYSTAL STRUCTURE, X RAY DIFFRACTION), INTENSITY, CONTROL SEQUENCES, CURVE FITTING, SCATTERING, ABSORPTION, POLARIZATION

Subject Categories : Computer Programming and Software
      Crystallography

Distribution Statement : APPROVED FOR PUBLIC RELEASE