Accession Number : AD0754101
Title : Laser Mirror Technology.
Descriptive Note : Annual rept. Jul 71-Jul 72,
Corporate Author : NAVAL WEAPONS CENTER CHINA LAKE CALIF
Personal Author(s) : Bennett,H. E. ; Stanford,J. L. ; Bennett,J. M. ; Westmacott,K. H. ; Burge,D. K.
Report Date : NOV 1972
Pagination or Media Count : 23
Abstract : The effects of microroughness, crystalline imperfections, and thin film deposition conditions on the absorption of infrared radiation by laser mirrors are discussed. New instruments described include the Optical Evaluation Facility for measuring absorption and scattering from samples of arbitrary size and curvature, and a modulated ellipsometer for in situ measurements of optical properties of samples under ultrahigh vacuum conditions and conditions of known residual gas environment. Techniques for characterizing surfaces with microirregularities using optical scattering, optical and electron microscopy, and interferometry are described. Initial results obtained using the modulated ellipsometer are discussed, and data obtained from measurements of infrared absorption on silver surfaces of known roughness are presented. (Author)
Descriptors : (*LASERS, *MIRRORS), SURFACE ROUGHNESS, REFLECTION, INFRARED RADIATION, ABSORPTION SPECTRA, DEFECTS(MATERIALS), SCATTERING, TEST METHODS
Subject Categories : Lasers and Masers
Distribution Statement : APPROVED FOR PUBLIC RELEASE