Accession Number : AD0754878

Title :   Ellipsometric Study of Polished Glass Surfaces,

Corporate Author : TOKAI UNIV HIRATSUKA (JAPAN) DEPT OF ELECTRO-PHOTO-OPTICS ENGINEERI

Personal Author(s) : Yokota,H. ; Sakata,H. ; Nishibori,M. ; Kinosita,K.

Report Date : 1969

Pagination or Media Count : 10

Abstract : The refractive index n(f) and thickness d(f) of the 'polish layer' on the surface of various kinds of glass polished under standard conditions were determined by ellipsometry. The method of ellipsometry employed was based on the measurement of the principal angle of incidence and the ellipticity of the light reflected at this angle. (Author)

Descriptors :   (*OPTICAL GLASS, REFLECTIVITY), SURFACE PROPERTIES, REFRACTIVE INDEX, THICKNESS, POLISHES, JAPAN

Subject Categories : Test Facilities, Equipment and Methods
      Optics

Distribution Statement : APPROVED FOR PUBLIC RELEASE