Accession Number : AD0761104

Title :   Emission Spectrographic Determination of Metallic Impurities in Silicon Nitride by a Solution Method,

Descriptive Note : Product technical rept.,

Corporate Author : ARMY MATERIALS AND MECHANICS RESEARCH CENTER WATERTOWN MASS

Personal Author(s) : Ferraro,Thomas A. , Jr. ; Strauss,Bernard H.

Report Date : APR 1973

Pagination or Media Count : 12

Abstract : mpurities in Silicon Nitride by a Solution Method,Product technical rept.,Ferraro,Thomas A. , Jr.;Strauss,Bernard H. ;AMMRC-PTR-73-5(*silicon compounds, chemical analysis), (*atomic spectroscopy, silicon compounds), nitrides, impurities*silicon nitrides, *spectrochemical analysis, dissolvingA method for the dissolution and spectrographic analysis of silicon nitride is described. Samples are dissolved in teflon-lined acid digestion bombs using a mixture of hydrofluoric and nitric acids. After removal of silicon as the volatile fluoride, the samples are analyzed by a solution-spectrographic method. Results and standard deviations obtained for aluminum, iron, titanium, chromium, manganese, magnesium, and calcium are reported. The values are compared with those obtained by spectrophotometric methods. (Author)

Descriptors :   (*SILICON COMPOUNDS, CHEMICAL ANALYSIS), (*ATOMIC SPECTROSCOPY, SILICON COMPOUNDS), NITRIDES, IMPURITIES

Subject Categories : Inorganic Chemistry

Distribution Statement : APPROVED FOR PUBLIC RELEASE