Accession Number : AD0762234

Title :   The Diagnostics of Malfunctions Which Cause Competitions,

Corporate Author : FOREIGN TECHNOLOGY DIV WRIGHT-PATTERSON AFB OHIO

Personal Author(s) : Tomfeld,Yu. L.

Report Date : 08 JUN 1973

Pagination or Media Count : 13

Abstract : The report discusses testing for failures in logic circuits and switching circuits.

Descriptors :   (*LOGIC CIRCUITS, FAILURE), INPUT OUTPUT DEVICES, USSR, SWITCHING CIRCUITS

Subject Categories : Electrical and Electronic Equipment
      Computer Hardware

Distribution Statement : APPROVED FOR PUBLIC RELEASE