Accession Number : AD0766594

Title :   Evaluation of Infrared Thermal Profile Analysis for Electronic Circuit Card Testing.

Descriptive Note : Final rept. Oct 71-Jul 73,

Corporate Author : AERONAUTICAL SYSTEMS DIV WRIGHT-PATTERSON AFB OHIO ELECTRONICS SUPPORT DIV

Personal Author(s) : Murphy,Thomas M.

Report Date : 17 JUL 1973

Pagination or Media Count : 22

Abstract : The report includes an evaluation of infrared radiation used to detect and isolate failures in electronic circuit cards. (Author)

Descriptors :   (*PRINTED CIRCUITS, NONDESTRUCTIVE TESTING), (*NONDESTRUCTIVE TESTING, INFRARED RADIATION), INFRARED SCANNING, FAILURE(ELECTRONICS), MODULES(ELECTRONICS)

Subject Categories : Electrical and Electronic Equipment
      Test Facilities, Equipment and Methods

Distribution Statement : APPROVED FOR PUBLIC RELEASE