Accession Number : AD0766820

Title :   Scanning Ellipsometry as a Tool for the Characterization of Absorbing Surface Films.

Descriptive Note : Technical rept.,

Corporate Author : CASE WESTERN RESERVE UNIV CLEVELAND OHIO ELECTROCHEMISTRY RESEARCH LAB

Personal Author(s) : Horkans,Jean ; Cahan,B. D. ; Yeager,Ernest

Report Date : 01 JUN 1973

Pagination or Media Count : 82

Abstract : The general theory of reflection and of ellipsometry is reviewed. The new technique of scanning ellipsometry, which allows a conventional ellipsometer to be used to follow film growth dynamically, is described. A program is given which allows the characterization of an absorbing surface film (i.e., determination of its complex refractive index and thickness) from measured changes in the ellipsometric parameters Delta sub 0 and Psi sub 0 and in the relative reflectivity. The method is illustrated by an examination of the electrochemical formation of the anodic oxide film on platinum. (Author)

Descriptors :   (*ELECTROCHEMISTRY, *SURFACES), ELECTRODES, FILMS, LIGHT TRANSMISSION, THEORY, NUMERICAL ANALYSIS, COMPUTER PROGRAMS, OPTICAL PROPERTIES, REFLECTIVITY, POLARIZATION, OXIDES, PLATINUM

Subject Categories : Physical Chemistry

Distribution Statement : APPROVED FOR PUBLIC RELEASE