Accession Number : AD0767788

Title :   Diffraction Effects Encountered in the Measurement of Bidirectional Reflectance from Square Pyramid,

Corporate Author : DEFENCE RESEARCH ESTABLISHMENT VALCARTIER QUEBEC

Personal Author(s) : Christie,Fred A. ; DeVriendt,Andre B.

Report Date : 1973

Pagination or Media Count : 10

Abstract : Theoretically and photographically determined bidirectional reflectance data are presented for a set of sixteen regularly rough surfaces composed of square pyramids which were illuminated by a He-Ne laser beam. The included angles of the ruled V-grooves were 60, 90, 120 and 150 degrees, while the peak-to-valley depths were 2.5, 5, 10 and 20 microns. The photographs grapically illustrate a smooth transition from reflectance patterns predicted by diffraction theory to others described by conventional bidirectional reflectance theory. Although precise measurement is difficult in some diffuse patterns, agreement between the theoretical and photographic data was generally one degree or less. (Author)

Descriptors :   (*SURFACES, REFLECTIVITY), COHERENT RADIATION, REFLECTION, SURFACE PROPERTIES, CANADA

Subject Categories : Optics

Distribution Statement : APPROVED FOR PUBLIC RELEASE