Accession Number : AD0767790

Title :   Combined Ellipsometric and Soft X-Ray Spectroscopic Studies of Corrosion Processes on Transparent Materials.

Descriptive Note : Technical rept.,

Corporate Author : PENNSYLVANIA STATE UNIV UNIVERSITY PARK MATERIALS RESEARCH LAB

Personal Author(s) : Vedam,K. ; White,E. W.

Report Date : 05 OCT 1973

Pagination or Media Count : 28

Abstract : The feasibility of carrying out systematic and precise surface characterization studies on transparent materials by ellipsometry has been established. Specifically, it is shown that one can detect and quantitatively measure the extent of the damaged surface layers on such transparent materials. Similarly, it is shown that the soft x-ray spectroscopic method can be used to characterize the contaminant film on any material even though the film may be compositionally inhomogeneous. (Author)

Descriptors :   (*GLASS, SURFACE PROPERTIES), (*CORROSION, GLASS), (*X RAY SPECTROSCOPY, GLASS), CLEANING, SPUTTERING

Subject Categories : Ceramics, Refractories and Glass

Distribution Statement : APPROVED FOR PUBLIC RELEASE