Accession Number : AD0768088

Title :   Forbidden Si (442) Structure Factor.

Descriptive Note : Technical rept.,

Corporate Author : WATERVLIET ARSENAL N Y

Personal Author(s) : Gray,A. Marcus

Report Date : SEP 1973

Pagination or Media Count : 15

Abstract : A recent measurement by Trucano and Batterman of the forbidden Si (442) x-ray structure factor prompted the author to calculate this value by using a simple model for the electronic charge distribution with parameters determined from a given set of allowed formfactors. For the allowed formfactor experimental values of Raccah et al were used. For T = OK it was found that F(442) = 0.082 plus or minus 0.010, compared to Trucano and Batterman's bond value of 0.089 plus or minus 0.007 converted to T = OK. (Modified author abstract)

Descriptors :   (*SILICON, *X RAY DIFFRACTION), (*BAND THEORY OF SOLIDS, SILICON), CRYSTAL STRUCTURE

Subject Categories : Crystallography
      Solid State Physics

Distribution Statement : APPROVED FOR PUBLIC RELEASE