Accession Number : AD0773502
Title : Ellipsometric Examination of Passive Layers.
Descriptive Note : Final rept.,
Corporate Author : PENNSYLVANIA UNIV PHILADELPHIA DEPT OF CHEMISTRY
Personal Author(s) : Paik,W. K. ; Bockris,J. O'M.
Report Date : 17 DEC 1973
Pagination or Media Count : 31
Abstract : Studies covering (1) the effect of electromodulation upon ellipsometric measurements of adsorption in the double layer and (2) the ellipsometric measurement of thickness and optical properties of a thin light absorbing film have resulted in a method for ellipsometric measurement which avoids the necessity for auxiliary measurement. (Author)
Descriptors : *Thin films, Electrochemistry, Gold, Cobalt, Thickness, Reflection
Subject Categories : Physical Chemistry
Metallurgy and Metallography
Distribution Statement : APPROVED FOR PUBLIC RELEASE