Accession Number : AD0773502

Title :   Ellipsometric Examination of Passive Layers.

Descriptive Note : Final rept.,

Corporate Author : PENNSYLVANIA UNIV PHILADELPHIA DEPT OF CHEMISTRY

Personal Author(s) : Paik,W. K. ; Bockris,J. O'M.

Report Date : 17 DEC 1973

Pagination or Media Count : 31

Abstract : Studies covering (1) the effect of electromodulation upon ellipsometric measurements of adsorption in the double layer and (2) the ellipsometric measurement of thickness and optical properties of a thin light absorbing film have resulted in a method for ellipsometric measurement which avoids the necessity for auxiliary measurement. (Author)

Descriptors :   *Thin films, Electrochemistry, Gold, Cobalt, Thickness, Reflection

Subject Categories : Physical Chemistry
      Metallurgy and Metallography

Distribution Statement : APPROVED FOR PUBLIC RELEASE