Accession Number : AD0774311

Title :   Compton X-Ray Scattering.

Descriptive Note : Final technical rept.,

Corporate Author : FRITZ-HABER-INSTITUT DER MAX-PLANCK-GESELLSCHAFT BERLIN (WEST GERMANY)

Personal Author(s) : Hosemann,R. ; Mueller,A. ; Weick,D.

Report Date : DEC 1973

Pagination or Media Count : 16

Abstract : A new high precision method is developed for measuring Compton-line profiles quantitatively and to obtain the ratio of modified and unmodified radiation. The most important progress consisted in using monochromatic primary radiation produced by fluorescence. By an adapted geometrical arrangement the intensity-lost by monochromatization is only about 50%. The background until now in the order of 10% of the Compton peak is reduced to 0.2% for a paraffin scatterer and M0-Kx radiation. A small bump on the short wavelength flank of the paraffin-Compton-line profile is explained as PbLx,x2 lines. (Modified author abstract)

Descriptors :   *Compton scattering, *X ray spectroscopy, X ray spectra, X rays, Fluorescence, Experimental design, Background radiation, West Germany

Subject Categories : Atomic and Molecular Physics and Spectroscopy

Distribution Statement : APPROVED FOR PUBLIC RELEASE