Accession Number : AD0774796

Title :   Failure Analysis of AUTODIN Microelectronics.

Descriptive Note : Technical rept.,

Corporate Author : ARMY ELECTRONICS COMMAND FORT MONMOUTH N J

Personal Author(s) : Hakim,E. B. ; Holevinski,R.

Report Date : JAN 1974

Pagination or Media Count : 21

Abstract : A total of 401 integrated circuits (IC), both monolithic and hybrid, were investigated. These devices were obtained from AUTODIN systems, which were being repaired at the Tobyhanna Army Depot, Tobyhanna, Pa. Results are discussed.

Descriptors :   *Integrated circuits, Microelectronics, Department of Defense, Telephone systems, Failure(Electronics), Reliability(Electronics), Failure

Subject Categories : Electrical and Electronic Equipment

Distribution Statement : APPROVED FOR PUBLIC RELEASE