Accession Number : AD0775379

Title :   A Rapid X-ray Diffractometer Method for Monitoring the Purity of NH4ClO4.

Descriptive Note : Technical memo.,

Corporate Author : PICATINNY ARSENAL DOVER N J

Personal Author(s) : Bracuti ,Arthur J. ; Campisi,Joseph

Report Date : FEB 1974

Pagination or Media Count : 8

Abstract : The lattice parameters of six samples of NH4ClO4 and NH4ClO4/KclO4 solid solutions were determined by means of the wide angle X-ray diffractometer using fixed count techniques. This method of data retrieval using 1600 counts measured at 0.05 degrees 2 theta increments required about 10 minutes per reflection. The approximation method was employed for all calculations. The results indicated that this technique could be used to monitor the purity of NH4ClO4 with regard to KClO4 as solute in the NH4ClO4/KClO4 solid solution system. (Author)

Descriptors :   *Ammonium perchlorate, *Purity, *X ray diffraction, Potassium compounds, Perchlorates, Crystal structure

Subject Categories : Physical Chemistry

Distribution Statement : APPROVED FOR PUBLIC RELEASE