Accession Number : AD0775547
Title : Measurement of X-Ray Cross Sections Relevant to a Scanning Ion Microscope.
Descriptive Note : Annual rept. no. 1, 1 Jul 72-30 Jun 73,
Corporate Author : MARYLAND UNIV COLLEGE PARK DEPT OF PHYSICS AND ASTRONOMY
Personal Author(s) : Cacak,Robert K. ; Choe,Song Sik ; Martin,Frederick W.
Report Date : 26 OCT 1973
Pagination or Media Count : 41
Abstract : The purpose of the study is to determine the feasibility of using X rays generated by heavy ion-atom collisions as the monitoring signal in an ion microscope. Experimental progress in the design, construction, and operation of an experimental apparatus to measure the rate of X-ray production by heavy ions is described. Particular attention is paid to a new type of soft X-ray spectrometer. Preliminary X-ray cross sections obtained with the described apparatus are presented for 1.0 to 2.5 MeV ions incident upon a thin carbon target. The cross sections are found to increase with ion velocity in the range studied. (Modified author abstract)
Descriptors : *Microscopes, *Field emission, *X ray diffraction, Monitoring, X ray apparatus, Particle collisions, Spectrometers
Subject Categories : Test Facilities, Equipment and Methods
Distribution Statement : APPROVED FOR PUBLIC RELEASE