Accession Number : AD0775547

Title :   Measurement of X-Ray Cross Sections Relevant to a Scanning Ion Microscope.

Descriptive Note : Annual rept. no. 1, 1 Jul 72-30 Jun 73,

Corporate Author : MARYLAND UNIV COLLEGE PARK DEPT OF PHYSICS AND ASTRONOMY

Personal Author(s) : Cacak,Robert K. ; Choe,Song Sik ; Martin,Frederick W.

Report Date : 26 OCT 1973

Pagination or Media Count : 41

Abstract : The purpose of the study is to determine the feasibility of using X rays generated by heavy ion-atom collisions as the monitoring signal in an ion microscope. Experimental progress in the design, construction, and operation of an experimental apparatus to measure the rate of X-ray production by heavy ions is described. Particular attention is paid to a new type of soft X-ray spectrometer. Preliminary X-ray cross sections obtained with the described apparatus are presented for 1.0 to 2.5 MeV ions incident upon a thin carbon target. The cross sections are found to increase with ion velocity in the range studied. (Modified author abstract)

Descriptors :   *Microscopes, *Field emission, *X ray diffraction, Monitoring, X ray apparatus, Particle collisions, Spectrometers

Subject Categories : Test Facilities, Equipment and Methods
      Crystallography

Distribution Statement : APPROVED FOR PUBLIC RELEASE