Accession Number : AD0775740

Title :   Electrical Characterization of Complex Microcircuits,

Descriptive Note : Final technical rept. Jun 72-Jun 73,


Personal Author(s) : Citrin,David A.

Report Date : JAN 1974

Pagination or Media Count : 377

Abstract : The objective of this study has been to develop guidelines for the electrical characterization and testing of microcircuits of varying degrees of complexity and to aid in assuring conformance to their detailed specification. The 4000 series of CMOS circuits, 9500 and 10,000 series of ECL circuits, Schottky (T squared)L circuits, and a Phase Locked Loop were electrically characterized according to their DC, switching and functional characteristics. Vendor comparisons, specification guidelines, test circuits and design rules are included for each family where applicable. Studies in sufficient detail were performed to form the basis for the generation of MIL-M-38510 slash sheets for interchangeable parts for military use. A comprehensive electrical and functional evaluation of a semiconductor memory fabricated using the Isoplanar process was performed. (Modified author abstract)

Descriptors :   *Microcircuits, *Random access computer storage, Electrical properties, Test methods, Logic circuits, Metal oxide semiconductors, Schottky barrier devices, Phase locked systems, Reliability(Electronics)

Subject Categories : Electrical and Electronic Equipment
      Computer Hardware

Distribution Statement : APPROVED FOR PUBLIC RELEASE