Accession Number : AD0775789

Title :   Reliability Theory and Applications to Electromagnetic Pulse Testing,

Corporate Author : HARRY DIAMOND LABS WASHINGTON D C

Personal Author(s) : Tumolillo,Thomas A.

Report Date : FEB 1973

Pagination or Media Count : 37

Abstract : Methods for calculating the reliability for EMP-perturbed systems are presented and discussed. Formulas for the reliability of components subjected to random stresses are derived with the aid of the theory of discrete Markov processes. Techniques for evaluating the formulas are illustrated by examples. The reliability of systems subjected to certain types of failure and repair is computed. Techniques for solving the resulting differential equations are derived. The theory of structure reliability in terms of component reliability is extended to include continuous Markov processes which arise in the consideration of electromagnetic-pulse (EMP) perturbations of a complex structure. Classical methods for evaluating reliability functions for communications systems are presented and their applicability to EMP problems considered. The work was sponsored by the joint DCA/DNA Program for EMP testing (PREMPT). (Author)

Descriptors :   *RELIABILITY(ELECTRONICS), *ELECTROMAGNETIC PULSES, STOCHASTIC PROCESSES, PROBABILITY DENSITY FUNCTIONS, FAILURE

Subject Categories : Mfg & Industrial Eng & Control of Product Sys
      Non-radio Communications

Distribution Statement : APPROVED FOR PUBLIC RELEASE