Accession Number : AD0776026

Title :   A Study of Electronics Radiation Hardness Assurance Techniques. Volume I. Background, Approach, and Summary of Results.

Descriptive Note : Final rept. 31 Jul 70-16 Jul 73,

Corporate Author : BOEING CO SEATTLE WASH

Personal Author(s) : Arimura,I.

Report Date : JAN 1974

Pagination or Media Count : 150

Abstract : The report describes the results of a comprehensive study which was designed to determine improved techniques for providing radiation hardness assurance on modern electronic systems. The two basic goals considered were (1) to determine from physical reasoning and large scale testing the effectiveness of established electrical screening parameters and the existence of additional ones which might be correlated with radiation responses and (2) to establish a statistical comparison between the various hardness assurance techniques including electrical screening, lot sampling and irradiate-and-anneal.

Descriptors :   *RADIATION HARDENING, *QUALITY ASSURANCE, *RELIABILITY(ELECTRONICS), ELECTRONIC EQUIPMENT, RELIABILITY, SEMICONDUCTOR DEVICES, TRANSISTORS, INTEGRATED CIRCUITS, TRANSIENT RADIATION EFFECTS, IONIZING RADIATION, ANNEALING, IRRADIATION, FAILURE(ELECTRONICS)

Subject Categories : Mfg & Industrial Eng & Control of Product Sys

Distribution Statement : APPROVED FOR PUBLIC RELEASE