Accession Number : AD0777185
Title : A Study of Electronics Radiation Hardness Assurance Techniques. Volume II, Part 1. Electrical Screening for Neutron Effects.
Descriptive Note : Final rept. 31 Jul 70-16 Jul 73,
Corporate Author : BOEING CO SEATTLE WASH
Personal Author(s) : Arimura,I. ; Johnston,Allan H. ; Sivo,L. L. ; Egelkrout,D. W.
Report Date : JAN 1974
Pagination or Media Count : 173
Abstract : The report describes the results of a comprehensive study which was designed to determine improved techniques for providing radiation hardness assurance on modern electronic systems. The electrical screening approach examined correlations between certain initial electrical parameters and the radiation sensitivities of the devices. The correlation parameters were selected on the basis of physical reasoning and the radiation sensitivites were defined differently for the various radiation environments. Neutron hardness assurance is treated first and the various classes of devices such as low-power transistors, high-power transistors, JFETs and ICs are discussed separately.
Descriptors : *RADIATION HARDENING, *ELECTRONIC EQUIPMENT, *QUALITY ASSURANCE, *RELIABILITY(ELECTRONICS), TEST METHODS, SEMICONDUCTOR DEVICES, TRANSISTORS, INTEGRATED CIRCUITS, TRANSIENT RADIATION EFFECTS, IONIZING RADIATION, FAILURE(ELECTRONICS), RELIABILITY, NEUTRONS, LOGIC CIRCUITS
Subject Categories : Electrical and Electronic Equipment
Mfg & Industrial Eng & Control of Product Sys
Distribution Statement : APPROVED FOR PUBLIC RELEASE