Accession Number : AD0777187

Title :   A Study of Electronics Radiation Hardness Assurance Techniques. Volume II, Part 3. Electrical Screening for Second Breakdown.

Descriptive Note : Final rept. 31 Jul 70-16 Jul 73,

Corporate Author : BOEING CO SEATTLE WASH

Personal Author(s) : Arimura,I. ; Johnston,Allan H. ; Sivo,L. L. ; Egelkrout,D. W.

Report Date : JAN 1974

Pagination or Media Count : 130

Abstract : The objectives of the second breakdown (SB) program were to determine analytical dependences for IC and power transistor SB susceptibility in neutron and gamma ray environments and to investigate means of prediction of SB in a radiation environment through nondestructive screening methods.

Descriptors :   *RADIATION HARDENING, *ELECTRONIC EQUIPMENT, *QUALITY ASSURANCE, *RELIABILITY(ELECTRONICS), NONDESTRUCTIVE TESTING, SEMICONDUCTOR DEVICES, TRANSISTORS, INTEGRATED CIRCUITS, IONIZING RADIATION, TRANSIENT RADIATION EFFECTS, NEUTRONS, LOGIC CIRCUITS, FAILURE(ELECTRONICS), RELIABILITY

Subject Categories : Electrical and Electronic Equipment
      Mfg & Industrial Eng & Control of Product Sys

Distribution Statement : APPROVED FOR PUBLIC RELEASE