Accession Number : AD0778754

Title :   Analysis of Failure of Electronic Circuits from EMP-Induced Signals: Review and Contribution,

Corporate Author : HARRY DIAMOND LABS WASHINGTON D C

Personal Author(s) : Kalab,Bruno

Report Date : AUG 1973

Pagination or Media Count : 128

Abstract : The elements (circuit models, condition for damage, or damage thresholds, of semiconductor components, circuit analysis codes) of a method (circuit-failure analysis) for determining damage in an electronic system from a signal induced by an electromagnetic pulse (EMP) are discussed. The state of the art in the areas of circuit models, damage thresholds, etc., is compared with the information and capability required for circuit-failure analysis. Results of research into second breakdown are discussed to the extent they relate to the condition for damage of junction components from electrical transients. (Modified author abstract)

Descriptors :   *TRANSIENT RADIATION EFFECTS, *ELECTROMAGNETIC PULSES, *CIRCUITS, *SEMICONDUCTOR DEVICES, FAILURE, FAILURE(ELECTRONICS), MODELS

Subject Categories : Electrical and Electronic Equipment

Distribution Statement : APPROVED FOR PUBLIC RELEASE