
Accession Number : AD0779459
Title : Current Mode Second Breakdown.
Descriptive Note : Technical rept.,
Corporate Author : ALABAMA UNIV UNIVERSITY DEPT OF ELECTRICAL ENGINEERING
Personal Author(s) : Raburn,W. D.
Report Date : 07 NOV 1973
Pagination or Media Count : 20
Abstract : A discussion on current mode second breakdown is given. A computer model is given which shows the voltagecurrent density characteristic with different injection ratios for the n(+) np(+) diode with reachthrough. The model shows that there will always be a negative differential resistance for any injection ratio at high current densities. It is argued, however, that the experimentally observed second breakdown must be explained by a sudden change in injection ratio and not by the change in voltage with any given injection ratio. A discussion of the importance of the base resistance in causing a change in injection ratio is given. Finally an approximate physical model and experimental verification are given. (Author)
Descriptors : *Semiconductor devices, *Failure(Electronics), Semiconductor junctions, Electric current, Thermal properties, Mathematical models
Subject Categories : Electrical and Electronic Equipment
Distribution Statement : APPROVED FOR PUBLIC RELEASE