Accession Number : AD0779459

Title :   Current Mode Second Breakdown.

Descriptive Note : Technical rept.,

Corporate Author : ALABAMA UNIV UNIVERSITY DEPT OF ELECTRICAL ENGINEERING

Personal Author(s) : Raburn,W. D.

Report Date : 07 NOV 1973

Pagination or Media Count : 20

Abstract : A discussion on current mode second breakdown is given. A computer model is given which shows the voltage-current density characteristic with different injection ratios for the n(+) np(+) diode with reach-through. The model shows that there will always be a negative differential resistance for any injection ratio at high current densities. It is argued, however, that the experimentally observed second breakdown must be explained by a sudden change in injection ratio and not by the change in voltage with any given injection ratio. A discussion of the importance of the base resistance in causing a change in injection ratio is given. Finally an approximate physical model and experimental verification are given. (Author)

Descriptors :   *Semiconductor devices, *Failure(Electronics), Semiconductor junctions, Electric current, Thermal properties, Mathematical models

Subject Categories : Electrical and Electronic Equipment

Distribution Statement : APPROVED FOR PUBLIC RELEASE