Accession Number : AD0779666

Title :   Pulse Power Studies of Hardened Microcircuits.

Descriptive Note : Final rept. Nov 71-May 73,

Corporate Author : TEXAS INSTRUMENTS INC DALLAS

Personal Author(s) : Kennan,W. F. ; Smith,D. M.

Report Date : DEC 1973

Pagination or Media Count : 83

Abstract : A study was made of the effects of large amplitude transient pulses on radiation tolerant integrated circuits. Two distinct burnout mechanisms exist, diode failure and resistor burnout. Both mechanisms were investigated independently by test structures to measure the influence of processing variations on the failure levels. (Modified author abstract)

Descriptors :   *Microcircuits, *Integrated circuits, Radiation hardening, Transient radiation effects, Transients, Resistors, Semiconductor diodes, Vulnerability

Subject Categories : Electrical and Electronic Equipment

Distribution Statement : APPROVED FOR PUBLIC RELEASE