Accession Number : AD0779666
Title : Pulse Power Studies of Hardened Microcircuits.
Descriptive Note : Final rept. Nov 71-May 73,
Corporate Author : TEXAS INSTRUMENTS INC DALLAS
Personal Author(s) : Kennan,W. F. ; Smith,D. M.
Report Date : DEC 1973
Pagination or Media Count : 83
Abstract : A study was made of the effects of large amplitude transient pulses on radiation tolerant integrated circuits. Two distinct burnout mechanisms exist, diode failure and resistor burnout. Both mechanisms were investigated independently by test structures to measure the influence of processing variations on the failure levels. (Modified author abstract)
Descriptors : *Microcircuits, *Integrated circuits, Radiation hardening, Transient radiation effects, Transients, Resistors, Semiconductor diodes, Vulnerability
Subject Categories : Electrical and Electronic Equipment
Distribution Statement : APPROVED FOR PUBLIC RELEASE