Accession Number : AD0779757
Title : Two Systems for Measurement of High-Instensity Vacuum Ultraviolet Plasma Radiation.
Descriptive Note : Final rept. Jul 72-Jan 74,
Corporate Author : AIR FORCE WEAPONS LAB KIRTLAND AFB N MEX
Personal Author(s) : Johnson,David J.
Report Date : MAY 1974
Pagination or Media Count : 38
Abstract : An x-ray diode is presented for measurement of vacuum ultraviolet (UV) plasma emission on a nanosecond time basis. Response curves for the diode are obtained via a first-order photoelectric emission model. A windowless ionization chamber system is presented which is designed for use as a vacuum UV calorimeter. The response curves for this system are also obtained via a first order theoretical model. (Author)
Descriptors : *Plasmas(Physics), *Ultraviolet radiation, Solid state electronics, Detectors, X rays, Ionization chambers, Diodes
Subject Categories : Plasma Physics and Magnetohydrodynamics
Distribution Statement : APPROVED FOR PUBLIC RELEASE