Accession Number : AD0779757

Title :   Two Systems for Measurement of High-Instensity Vacuum Ultraviolet Plasma Radiation.

Descriptive Note : Final rept. Jul 72-Jan 74,

Corporate Author : AIR FORCE WEAPONS LAB KIRTLAND AFB N MEX

Personal Author(s) : Johnson,David J.

Report Date : MAY 1974

Pagination or Media Count : 38

Abstract : An x-ray diode is presented for measurement of vacuum ultraviolet (UV) plasma emission on a nanosecond time basis. Response curves for the diode are obtained via a first-order photoelectric emission model. A windowless ionization chamber system is presented which is designed for use as a vacuum UV calorimeter. The response curves for this system are also obtained via a first order theoretical model. (Author)

Descriptors :   *Plasmas(Physics), *Ultraviolet radiation, Solid state electronics, Detectors, X rays, Ionization chambers, Diodes

Subject Categories : Plasma Physics and Magnetohydrodynamics

Distribution Statement : APPROVED FOR PUBLIC RELEASE