Accession Number : AD0780912
Title : Failure Mechanisms in Irradiated Plastic Integrated Circuits.
Descriptive Note : Final rept. 1 Jul-31 Dec 73,
Corporate Author : MARTIN MARIETTA AEROSPACE ORLANDO FLA
Personal Author(s) : Taylor,Sheldon A.
Report Date : APR 1974
Pagination or Media Count : 140
Abstract : The program was devised to evaluate the performance of plastic integrated circuits in various types of radiation environments. Two different test parts were employed. These parts were selected to be representative of broad semiconductor processing technologies. The bipolar process technology was represented by 741 operational amplifier. The complementary metal-oxide-silicon (CMOS) process was represented by the 4028 binary-to-decimal decoder. (Modified author abstract)
Descriptors : *Integrated circuits, Radiation effects, Encapsulation, Plastics, Failure(Electronics), Reliability(Electronics)
Subject Categories : Electrical and Electronic Equipment
Distribution Statement : APPROVED FOR PUBLIC RELEASE