Accession Number : AD0781247

Title :   A Device for Measuring Thermoelectric and Thermomagnetic Efficiency of Semiconductors,

Corporate Author : ARMY FOREIGN SCIENCE AND TECHNOLOGY CENTER CHARLOTTESVILLE VA

Personal Author(s) : Supostat,S. A. ; Tikhomirov,B. G.

Report Date : 03 MAY 1974

Pagination or Media Count : 5

Abstract : The authors have designed a device for direct measurement of thermoelectric and thermomagnetic efficiency based on Harman's method and Harman's modified methods respectively, on which preliminary measurements were made. Research in a temperature range of 100-400K are possible.

Descriptors :   *Semiconductors, *Test equipment, Thermoelectricity, Thermophysical properties, Magnetic properties, Translations, USSR

Subject Categories : Solid State Physics

Distribution Statement : APPROVED FOR PUBLIC RELEASE