Accession Number : AD0781247
Title : A Device for Measuring Thermoelectric and Thermomagnetic Efficiency of Semiconductors,
Corporate Author : ARMY FOREIGN SCIENCE AND TECHNOLOGY CENTER CHARLOTTESVILLE VA
Personal Author(s) : Supostat,S. A. ; Tikhomirov,B. G.
Report Date : 03 MAY 1974
Pagination or Media Count : 5
Abstract : The authors have designed a device for direct measurement of thermoelectric and thermomagnetic efficiency based on Harman's method and Harman's modified methods respectively, on which preliminary measurements were made. Research in a temperature range of 100-400K are possible.
Descriptors : *Semiconductors, *Test equipment, Thermoelectricity, Thermophysical properties, Magnetic properties, Translations, USSR
Subject Categories : Solid State Physics
Distribution Statement : APPROVED FOR PUBLIC RELEASE