Accession Number : AD0782244

Title :   Contamination Effects in a Laminar Proportional Amplifier.

Descriptive Note : Final rept.,

Corporate Author : VIRGINIA POLYTECHNIC INST AND STATE UNIV BLACKSBURG DEPT OF MECHANICAL ENGINEERING

Personal Author(s) : Comparin,Robert A. ; Moses,Hal L. ; Rowell,Eugene E. , III

Report Date : JUN 1974

Pagination or Media Count : 70

Abstract : Contamination of a fluidic device is defined as the buildup of deposits on the internal surfaces of the device. The contaminants are carried into the device by the fluid used to operate it. A laminar proportional amplifier was tested with a contaminated power supply to determine the nature and location of contaminant deposits and their effect upon the performance of the device. Gain curves and photographs of the deposits were obtained to establish a time history of the contamination effects. The results show that contamination can cause changes in gain, pressure recovery and null point. Also, severe inlet plugging can occur with a simple right-angle power supply entry and rapid outlet plugging occurs with a low aspect ratio. A detailed summary of the results is presented together with some recommended geometrical changes to reduce sensitivity to contamination. (Author)

Descriptors :   *FLUIDICS, *FLUID AMPLIFIERS, *CONTAMINATION, POWER SUPPLIES, CONTAMINANTS, DEPOSITS, NOZZLES, FLUERICS, FLUERIC DEVICES

Subject Categories : Fluidics and Fluerics

Distribution Statement : APPROVED FOR PUBLIC RELEASE