Accession Number : AD0782553

Title :   Study of Film Structure on a Commutator Formed by Brushes of Niobium-Diselenide-Graphite Composition,

Corporate Author : FOREIGN TECHNOLOGY DIV WRIGHT-PATTERSON AFB OHIO

Personal Author(s) : Kalikhman,V. L. ; Duksina,A. G. ; Titov,V. S. ; Granovskii,E. B.

Report Date : 24 JUN 1974

Pagination or Media Count : 9

Abstract : Methods of electron microscopy and microdiffraction are used to study a film of polish formed on a short-circuited M-1 copper commutator by brushes of niobium-diselenide-graphite composition. (Author)

Descriptors :   *Electronic commutators, *Brushes, Niobium compounds, Selenides, Films, Copper, Electron microscopy, Electron diffraction, Translations, USSR

Subject Categories : Electrical and Electronic Equipment

Distribution Statement : APPROVED FOR PUBLIC RELEASE