Accession Number : AD0785126

Title :   Dynamic Analysis of MNOS Memory Devices.

Descriptive Note : Master's thesis,

Corporate Author : AIR FORCE INST OF TECH WRIGHT-PATTERSON AFB OHIO SCHOOL OF ENGINEERING

Personal Author(s) : Showers,Jerry L.

Report Date : JUN 1974

Pagination or Media Count : 95

Abstract : The study determines and demonstrates the feasibility of using the Macrodata MD-104 Test System for analysis of MNOS memory devices. The MD-104 Test System is a high-speed automatic unit designed to test semiconductor memories. The processor of this system regards the device under test as a logical black box, and the conditions that are particular to the device being tested are established on an interface board called a 'personality card'. A personality board was designed for the National Cash Register 1105 Electrically Alterable Read Only Memory. The NCR 1105 employs MNOS memory transistors in the memory array. The MD-104 Test System was used with the personality board to test the D.C. and A.C. operating characteristics of the NCR 1105 memory. (Author)

Descriptors :   *Memory devices, Metals, Nitrides, Oxides, Silicon, Test methods, Feasibility studies, Theses

Subject Categories : Computer Hardware

Distribution Statement : APPROVED FOR PUBLIC RELEASE