Accession Number : AD0785920

Title :   Microcircuit Device Environmental Data.

Corporate Author : IIT RESEARCH INST CHICAGO ILL RELIABILITY ANALYSIS CENTER

Report Date : APR 1974

Pagination or Media Count : 369

Abstract : The tabulation contains environmental test results which are organized and presented by device manufacturer and part numbers. It provides, for each entry, a description of the device function, technology, package type, screen level and manufacturing date (date code), in addition to the applied environmental conditions. Percent defective statistics and failure modes/mechanisms are reported. The compendium is updated in its entirety and reissued annually. (Author)

Descriptors :   *Microcircuits, *Integrated circuits, Reliability(Electronics), Environmental tests, Hybrid circuits

Subject Categories : Electrical and Electronic Equipment

Distribution Statement : APPROVED FOR PUBLIC RELEASE