Accession Number : AD0786022
Title : Radiation Hardening of Linear Microcircuits by Terminal Photocompensation.
Descriptive Note : Final rept. 15 Apr 72-1 Aug 73,
Corporate Author : NORTHROP RESEARCH AND TECHNOLOGY CENTER HAWTHORNE CALIF
Personal Author(s) : Pocock,D. N. ; Krebs,M. G.
Report Date : JUN 1974
Pagination or Media Count : 124
Abstract : The feasibility of using terminal photocompensation to reduce the ionizing-radiation vulnerability of linear microcircuit amplifiers is investigated. An analytical basis for terminal 'photocharge' compensation is presented. Linear terminal models are developed for four types of integrated circuit amplifiers and are used to analyze the qualitative effects of terminal photocompensation. Experimental results show that two of the four microcircuits can be photocompensated with at least an order-of-magnitude reduction in the radiation-induced noise energy for several cases of external circuit configuration and radiation intensity. (Author)
Descriptors : *MICROCIRCUITS, *RADIATION HARDENING, LINEAR SYSTEMS, INTEGRATED CIRCUITS, PHOTOELECTRICITY, ELECTRIC CURRENT, COMPENSATION
Subject Categories : Electrical and Electronic Equipment
Distribution Statement : APPROVED FOR PUBLIC RELEASE