Accession Number : AD0786024

Title :   Rework of Linear Integrated Circuits.

Descriptive Note : Final rept. 31 May 72-18 Feb 74,

Corporate Author : TEXAS INSTRUMENTS INC DALLAS SEMICONDUCTOR GROUP

Personal Author(s) : Lipman,James A.

Report Date : JUN 1974

Pagination or Media Count : 72

Abstract : A-C probe techniques for screens and controls were evaluated to ensure radiation hardness of integrated circuits (ICs). A dielectrically isolated, photocurrent compensated linear IC was the test vehicle. A special metal pattern was used to isolate and provide probe pad leads for each active device on the IC. Air Force Weapons Laboratory personnel then probed the devices to determine the parameters that might indicate neutron hardness assurance. After the probing, the metal pattern was removed from a number of the devices which were then processed normally with NiCr, metal, and quartz overcoat. Possible damage to the silicon transistors caused by the special or the normal processes was evaluated by photographing a number of the bars and some slices from the devices. A unique procedure was used to label the separate bars so that their physical location on the slice could be determined after dicing. (Author)

Descriptors :   *INTEGRATED CIRCUITS, *RADIATION HARDENING, TRANSISTORS, RELIABILITY(ELECTRONICS), NEUTRONS, TEST METHODS

Subject Categories : Electrical and Electronic Equipment
      Mfg & Industrial Eng & Control of Product Sys

Distribution Statement : APPROVED FOR PUBLIC RELEASE