Accession Number : AD0786892
Title : Stress Wave Measurements in a High Noise Environment.
Descriptive Note : Final rept. Oct 72-Dec 73,
Corporate Author : KTECH CORP ALBUQUERQUE N MEX
Personal Author(s) : Butters,William G. ; Jenrette,Boyd D.
Report Date : SEP 1974
Pagination or Media Count : 63
Abstract : Thin flyers accelerated by magnetic repulsion have been used extensively for studying the response of materials to shock-wave and structural loadings. Analysis of the resulting behavior requires experimental parameters to be actively monitored and recorded. Measurement of the stress loading introduced into the sample and the resulting transmitted profile has been limited due to the severe electrical and shock environment of the tests. This document outlines the modification of an existing carbon gauge concept to allow its use in high electrical noise environment. Data are presented as stress versus time history of several types of experimental configuration. Included is a brief analysis showing correlation between theoretical and experimental data. (Modified author abstract)
Descriptors : *Flyer plates, *Stress waves, Noise(Electrical and electromagnetic), Capacitors, Magnetic fields, Stress testing, Impact tests
Subject Categories : Test Facilities, Equipment and Methods
Distribution Statement : APPROVED FOR PUBLIC RELEASE