Accession Number : AD0800562

Title :   Z(PROGRAM 461)Z IMPROVED PART SCREENING IMPLEMENTATION PLAN.

Corporate Author : LOCKHEED MISSILES AND SPACE CO INC SUNNYVALE CA

Report Date : 28 DEC 1964

Pagination or Media Count : 32

Abstract : Contents: Improved Part Screening Implementation; Phase I Application of Mature Techniques; Phase II - Extension of Mature Techniques to New Part Types; Phase III - Application of Developmental Techniques; and Continuous Activities.

Descriptors :   *CHECKOUT PROCEDURES), (*TEST METHODS, (*ELECTRONIC EQUIPMENT, QUALITY CONTROL), RELIABILITY(ELECTRONICS), DIODES, FAILURE(ELECTRONICS), RESISTORS, CAPACITORS, SEMICONDUCTOR DEVICES, TEMPERATURE, STRESSES, MANUFACTURING, SCHEDULING, SPECIFICATIONS, INFRARED SCANNING, INTEGRATED CIRCUITS, ELECTRON BEAMS, AUTOMATIC.

Subject Categories : Electrical and Electronic Equipment
      Mfg & Industrial Eng & Control of Product Sys
      Infrared Detection and Detectors

Distribution Statement : APPROVED FOR PUBLIC RELEASE