Accession Number : AD0802274

Title :   RESEARCH AND DEVELOPMENT PROGRAM INTRINSIC RELIABILITY SUBMINIATURE CERAMIC CAPACITORS.

Descriptive Note : Quarterly rept. no. 16, 1 Mar-31 May 66,

Corporate Author : SPRAGUE ELECTRIC CO NORTH ADAMS MA

Personal Author(s) : Phillips, H. F. ; Prokopowicz, T. I.

Report Date : 31 MAY 1966

Pagination or Media Count : 42

Abstract : It appears that markedly non-ohmic current-voltage releationships for C67 MONOLYTHIC capacitors indicate inferior life test capability because of Schottky emission as surmised from the close fit of the data to Dushman-Richardson-Schottky equation. On the basis of the 1200-piece life test matrix, it appears that short-life MONOLYTHIC capacitors can be identified by a voltage screening procedure. Data on a preproduction sampling of 0.033 micro f C67 Case Size I MONOLYTHIC capacitors containing 1.0 mil dielectrics are presented. (Author)

Descriptors :   *SUBMINIATURE ELECTRONIC EQUIPMENT), (*CERAMIC CAPACITORS, BARIUM COMPOUNDS, TITANATES, DIELECTRICS, RELIABILITY(ELECTRONICS), TEST METHODS, VOLTAGE, TEMPERATURE, FAILURE(ELECTRONICS), MATHEMATICAL PREDICTION.

Subject Categories : Electrical and Electronic Equipment

Distribution Statement : APPROVED FOR PUBLIC RELEASE