Accession Number : AD0824902
Title : RESONANT FREQUENCY VARIATION IN A RESONANT GATE TRANSISTOR AS A FUNCTION OF TEMPERATURE AND POLARIZATION VOLTAGE.
Descriptive Note : Master's thesis,
Corporate Author : AIR FORCE INST OF TECH WRIGHT-PATTERSON AFB OH SCHOOL OF ENGINEERING
Personal Author(s) : Deschaines, Carroll Edward
Report Date : SEP 1967
Pagination or Media Count : 153
Abstract : A method of solving for the displacement and actual resonant frequency of a nonlinearly electrostatically loaded contilever beam is obtained. The method is written into a program for an IBM 1620 Computer. Output data from the program is used in another program written to characterize the resonant frequency of a Resonant Gate Transistor (RGT) versus polarization voltage and temperature. The coefficient of temperature for Young's Modulus for Gold is shown to vary at a rate dependent on the stress. An explicit expression is derived for the rate of polarization voltage compensation needed to maintain a constant frequency for the RGT with varying temperatures. (Author)
Descriptors : (*TRANSISTORS, RESONANT FREQUENCY), TUNED CIRCUITS, RESONANCE, GATES(CIRCUITS), STABILITY, INTEGRATED CIRCUITS, MOLECULAR ELECTRONICS, TEMPERATURE, POLARIZATION, BEAMS(STRUCTURAL), THESES, COMPUTER PROGRAMS.
Subject Categories : Electrical and Electronic Equipment
Computer Programming and Software
Distribution Statement : APPROVED FOR PUBLIC RELEASE