Accession Number : AD0824902

Title :   RESONANT FREQUENCY VARIATION IN A RESONANT GATE TRANSISTOR AS A FUNCTION OF TEMPERATURE AND POLARIZATION VOLTAGE.

Descriptive Note : Master's thesis,

Corporate Author : AIR FORCE INST OF TECH WRIGHT-PATTERSON AFB OH SCHOOL OF ENGINEERING

Personal Author(s) : Deschaines, Carroll Edward

Report Date : SEP 1967

Pagination or Media Count : 153

Abstract : A method of solving for the displacement and actual resonant frequency of a nonlinearly electrostatically loaded contilever beam is obtained. The method is written into a program for an IBM 1620 Computer. Output data from the program is used in another program written to characterize the resonant frequency of a Resonant Gate Transistor (RGT) versus polarization voltage and temperature. The coefficient of temperature for Young's Modulus for Gold is shown to vary at a rate dependent on the stress. An explicit expression is derived for the rate of polarization voltage compensation needed to maintain a constant frequency for the RGT with varying temperatures. (Author)

Descriptors :   (*TRANSISTORS, RESONANT FREQUENCY), TUNED CIRCUITS, RESONANCE, GATES(CIRCUITS), STABILITY, INTEGRATED CIRCUITS, MOLECULAR ELECTRONICS, TEMPERATURE, POLARIZATION, BEAMS(STRUCTURAL), THESES, COMPUTER PROGRAMS.

Subject Categories : Electrical and Electronic Equipment
      Computer Programming and Software

Distribution Statement : APPROVED FOR PUBLIC RELEASE