Accession Number : AD0836043
Title : DETERMINATION OF THICKNESS AND COMPOSITION OF THIN FILMS BY THE METHOD OF X-RAY FLUORESCENCE.
Descriptive Note : Master's thesis,
Corporate Author : AIR FORCE INST OF TECH WRIGHT-PATTERSON AFB OH SCHOOL OF ENGINEERING
Personal Author(s) : Carpenter, James Thomas
Report Date : FEB 1968
Pagination or Media Count : 73
Abstract : X-Ray fluorescence techniques were used to determine the thickness and composition of films of solid solution cadmium sulfide/selenide, using a G.E.XRD-6 system. Standard curves of Se K lambda and Cd K lambda x-ray fluorescence intensities versus film thickness were established for films (CdSe percentages 0,25,50,77, and 100%) up to 10.00 microns thick on aluminum substrates. Film thickness accuracies were 0.200 plus or minus 0.05-10.00 plus or minus 0.40 microns. Se K lambda to Cd K lambda intensity ratio was used to determine film composition to within 2%. Effects of molybdenum, niobium, copper, and glass substrates on fluorescence intensities were determined. (Author)
Descriptors : *X RAY SPECTROSCOPY), (*METAL FILMS, THICKNESS, CADMIUM SULFIDES, INTENSITY, CADMIUM SELENIDES, SUBSTRATES, MOLYBDENUM, NIOBIUM, CRYSTALS, COPPER, GLASS, SOLIDS, CRYSTAL LATTICES, SPECTROMETERS, X RAY DIFFRACTION, THESES.
Subject Categories : Metallurgy and Metallography
Atomic and Molecular Physics and Spectroscopy
Distribution Statement : APPROVED FOR PUBLIC RELEASE