
Accession Number : AD0838811
Title : INVESTIGATION OF THE FUNCTIONAL PERFORMANCE VARIATIONS OF AN INTEGRATED CIRCUIT CHIP AS A FUNCTION OF TEMPERATURE.
Descriptive Note : Master's thesis,
Corporate Author : AIR FORCE INST OF TECH WRIGHTPATTERSON AFB OH SCHOOL OF ENGINEERING
Personal Author(s) : Armstrong, Robert Powell
Report Date : NOV 1966
Pagination or Media Count : 170
Abstract : The paper discusses the laboratory methods and analysis techniques used in investigating the temperature effects upon the functional performance of a microelectronic circuit. The performance parameters investigated were output voltage, bandwidth, and phase shift between the input and output voltages. Nine sample devices were subjected to varied electrical and environmental input conditions in controlled laboratory experiments to collect data. Curve fitting techniques were used to determine the underlying mathematical relationships between the input conditions and the performance parameters. The coefficient of correlation for each equation was calculated as a measure of how well the equation described the process. The expected errors and their distributions were computed for each of the equations. Computer simulation techniques were used to generate the joint frequency distribution of the performance parameters. The temperature effects upon performance were investigated through the performance equations and appropriate derivatives of these equations. (Author)
Descriptors : (*INTEGRATED CIRCUITS, RELIABILITY(ELECTRONICS)), AUTOMATIC GAIN CONTROL, MICROELECTRONICS, TEMPERATURE, VOLTAGE, BANDWIDTH, PHASE SHIFT CIRCUITS, CURVE FITTING, ERRORS, FUNCTIONAL ANALYSIS, SIMULATION, THESES, TABLES(DATA), STATISTICAL DATA.
Subject Categories : Electrical and Electronic Equipment
Distribution Statement : APPROVED FOR PUBLIC RELEASE