Accession Number : AD0839663

Title :   ELECTRON PROBE MICROANALYSIS (LA MICRO-ANALYSE A L'AIDE DE LA SONDE ELECTRONIQUE),

Corporate Author : INSTITUTE OF MODERN LANGUAGES INC WASHINGTON DC

Personal Author(s) : Lartigau, Guy

Report Date : SEP 1968

Pagination or Media Count : 21

Abstract : Electron probe microanalysis, whether it be carried out point by point or by scanning, has been used chiefly to solve metallurgical problems. Among the advantages of the methods, one should point out: localization of the analysis, rapid execution, and the fact that the method is strictly non-destructive. Among the drawbacks, one should call attention to the necessity of making numerous corrections. The perfecting of the dosage of an element in a specimen type may be rather long and only after this method has been perfected, will it prove to be very rapid (the dosage of an element at one point takes approximately one minute). This method therefore seems particularly adaptable to routine studies, such as, for example, control of cathodes, grids and filaments of radio and television. (Author)

Descriptors :   *MICROANALYSIS), (*X RAY SPECTROSCOPY, ELECTRON BEAMS, NONDESTRUCTIVE TESTING, METALLURGY, ELECTRON GUNS, ELECTRON OPTICS, CORRECTIONS, FRANCE.

Subject Categories : Test Facilities, Equipment and Methods
      Atomic and Molecular Physics and Spectroscopy

Distribution Statement : APPROVED FOR PUBLIC RELEASE