Accession Number : AD0840020

Title :   INFRARED FOR ELECTRONICS EQUIPMENT DIAGNOSIS.

Descriptive Note : Final technical rept. 15 May 67-15 May 68,

Corporate Author : RAYTHEON CO WAYLAND MA WAYLAND LABS

Personal Author(s) : Stoddard, James F.

Report Date : AUG 1968

Pagination or Media Count : 295

Abstract : A study was conducted employing infrared techniques for fault isolation on complex electronic printed circuit panels. A study consisted of evaluating panels containing both random defects and circuit anomalies. It was verified that approximately 70% of the defects and anomalies were identified by infrared analysis. Fundamental work was carried on in two other areas. The first was making radiant energy available from components buried in a thick opaque encapsulating material and the second involved evaluating component temperatures using thermo-sensitive phosphors. It was verified that both approaches are feasible. Proposed specifications for infrared testing of electronic circuit assemblies were developed. These specifications stressed the system approach to infrared test equipment outlining the following test areas: acceptance testing, engineering design evaluation, stress analysis of component parts, reliability calculations, production testing and troubleshooting, and preventive maintenance. (Author)

Descriptors :   (*PRINTED CIRCUITS, NONDESTRUCTIVE TESTING), (*NONDESTRUCTIVE TESTING, INFRARED RADIATION), RADIOMETERS, THERMAL ANALYSIS, DEFECTS(MATERIALS), ANOMALIES, TEMPERATURE SENSITIVE ELEMENTS, PHOSPHORESCENT MATERIALS, SPECIFICATIONS, STATISTICAL ANALYSIS.

Subject Categories : Electrical and Electronic Equipment
      Mfg & Industrial Eng & Control of Product Sys

Distribution Statement : APPROVED FOR PUBLIC RELEASE