Accession Number : AD0841217

Title :   AN X-RAY METHOD FOR DETERMINATION OF DYSPROSIUM IN THIN FILMS.

Descriptive Note : Phase rept.,

Corporate Author : NAVAL AIR DEVELOPMENT CENTER WARMINSTER PA AERO-ELECTRONIC TECHNOLOGY DEPT

Personal Author(s) : Lutz, D.

Report Date : 16 SEP 1968

Pagination or Media Count : 15

Abstract : An X-ray fluorescence method for the quantitative determination of dysprosium in high temperature dielectric thin films has been developed. This method can detect dysprosium in as low an amount as a few micrograms. A statistical treatment of the data yielded an analytical expression for the quantity of dysprosium in micrograms as a function of the intensity of the dysprosium X-ray emission line above background. (Author)

Descriptors :   (*DIELECTRIC FILMS, IMPURITIES), (*DYSPROSIUM COMPOUNDS, NONDESTRUCTIVE TESTING), X RAY SPECTROSCOPY, FLUORESCENCE, SPECTRUM ANALYZERS, BORON COMPOUNDS, OXIDES, SILICON DIOXIDE.

Subject Categories : Miscellaneous Materials
      Test Facilities, Equipment and Methods

Distribution Statement : APPROVED FOR PUBLIC RELEASE