Accession Number : AD0841217
Title : AN X-RAY METHOD FOR DETERMINATION OF DYSPROSIUM IN THIN FILMS.
Descriptive Note : Phase rept.,
Corporate Author : NAVAL AIR DEVELOPMENT CENTER WARMINSTER PA AERO-ELECTRONIC TECHNOLOGY DEPT
Personal Author(s) : Lutz, D.
Report Date : 16 SEP 1968
Pagination or Media Count : 15
Abstract : An X-ray fluorescence method for the quantitative determination of dysprosium in high temperature dielectric thin films has been developed. This method can detect dysprosium in as low an amount as a few micrograms. A statistical treatment of the data yielded an analytical expression for the quantity of dysprosium in micrograms as a function of the intensity of the dysprosium X-ray emission line above background. (Author)
Descriptors : (*DIELECTRIC FILMS, IMPURITIES), (*DYSPROSIUM COMPOUNDS, NONDESTRUCTIVE TESTING), X RAY SPECTROSCOPY, FLUORESCENCE, SPECTRUM ANALYZERS, BORON COMPOUNDS, OXIDES, SILICON DIOXIDE.
Subject Categories : Miscellaneous Materials
Test Facilities, Equipment and Methods
Distribution Statement : APPROVED FOR PUBLIC RELEASE