Accession Number : AD0841681

Title :   MEASUREMENT TECHNIQUES FOR THE EFFECTS OF ELECTROMAGNETIC INTERFERENCE (EMI) ON INTEGRATED CIRCUIT DEVICES.

Descriptive Note : Final rept.,

Corporate Author : GRUMMAN AIRCRAFT ENGINEERING CORP BETHPAGE NY ELECTRONIC ENGINEERING DEPT

Personal Author(s) : McDonough, Leonard ; Volpe, Carmine ; Kauz, Fred

Report Date : SEP 1968

Pagination or Media Count : 256

Abstract : The effects of electromagnetic interference (EMI) on microelectronic circuits were investigated on a component basis to establish a methodology for a practical measurement technique to determine these effects. This investigation resulted in the development of breadboard instrumentation capable of subjecting microelectronic devices to radiated electromagnetic fields, and procedures to define and measure the effects of these controlled environments in terms of the device parameters. Essential to the implementation of this program were (1) a thorough microelectronic device characterization, (2) classification and definition of electromagnetic fields, and (3) design and fabrication of breadboard instrumentation capable of generating these fields and radiating the microelectronic devices under investigation. The semiautomatic test method developed and test data obtained during this program utilized low-level generators in conjunction with low-level device parameters. This approach of using a low-level indicating parameter, such as 'inherent ambient noise' of a device in the frequency domain, has provided the groundwork for predictive techniques to determine the effects of EMI on a device's response. (Author)

Descriptors :   *ELECTROMAGNETIC COMPATIBILITY), (*INTEGRATED CIRCUITS, TEST METHODS, RADIOFREQUENCY INTERFERENCE, ELECTROMAGNETIC SHIELDING, MICROELECTRONICS, ELECTROMAGNETIC FIELDS.

Subject Categories : Electrical and Electronic Equipment
      Radiofrequency Wave Propagation

Distribution Statement : APPROVED FOR PUBLIC RELEASE