Accession Number : AD0844973
Title : Reliability Prediction and Demonstration for Missile and Satellite Electronics.
Descriptive Note : Final rept. 27 Apr 67-24 May 68,
Corporate Author : TRW SYSTEMS GROUP REDONDO BEACH CA
Personal Author(s) : Bellinger, Dwight Q. ; McBride, Harold N. ; Bootman, Edward H.
Report Date : NOV 1968
Pagination or Media Count : 136
Abstract : This study evaluates the accuracy of a variety of pre-design and stress analysis reliability prediction techniques, applied to missile and satellite electronic equipments. Sources of prediction inaccuracy are investigated and identified. New and improved prediction techniques are developed and tested. Equipment design approach categories having different prediction accuracies for predictions performed in accordance with the RADC Reliability Notebook, Volume II, are developed and identified with statistical distributions characterizing their inaccuracies. Missile and satellite integrated circuit failure rate data are collected and analyzed to provide new base failure rates for missile and satellite applications. Degradation analysis techniques, including worst-case analysis, are identified, evaluated, and presented with a recommended approach for their application to missile and satellite electronics. Reliability demonstration techniques are reviewed, including the Bayesian technique and recommended demonstration approaches are provided for missile and satellite electronic systems. (Author)
Descriptors : (*RELIABILITY(ELECTRONICS), MATHEMATICAL PREDICTION), (*SPACECRAFT COMPONENTS, RELIABILITY(ELECTRONICS)), (*GUIDED MISSILE COMPONENTS, RELIABILITY(ELECTRONICS)), STATISTICAL ANALYSIS, INTEGRATED CIRCUITS, FAILURE(ELECTRONICS), DEGRADATION.
Subject Categories : Mfg & Industrial Eng & Control of Product Sys
Distribution Statement : APPROVED FOR PUBLIC RELEASE