Accession Number : AD0848789

Title :   Tube Failure Mechanisms.

Descriptive Note : Quarterly rept. no. 3, 1 Nov 68-31 Jan 69,

Corporate Author : RAYTHEON CO WALTHAM MA MICROWAVE AND POWER TUBE DIV

Personal Author(s) : Bouchard, Kenneth G. ; Weihrauch, Paul

Report Date : 07 FEB 1969

Pagination or Media Count : 22

Abstract : The purpose of this program is to investigate the nature and the principal causes of failures in microwave tubes. In this context, the following studies will be made: (a) An investigation of the factors influencing electrical breakdown in a vacuum and across the surface of a dielectric. (b) An investigation of the various electrical and surface properties of materials commonly used in microwave tubes, i.e., OFHC copper, alumina ceramic, tungsten thoria cermets, tungsten matrix, and others; in addition, less frequently used materials will be investigated, such as boron nitride and dispersion-strengthened copper. (c) Surface diffusion and other surface physics phenomena. (Author)

Descriptors :   (*ELECTRON TUBES, RELIABILITY(ELECTRONICS)), CATHODES(ELECTRON TUBES), COPPER, SURFACE PROPERTIES, ELECTRIC DISCHARGES, EMISSIVITY, SECONDARY EMISSION, STATIC ELECTRICITY, DEGRADATION, FAILURE(ELECTRONICS).

Subject Categories : Electrical and Electronic Equipment

Distribution Statement : APPROVED FOR PUBLIC RELEASE