Accession Number : AD0852719

Title :   Application of Quartz Resonators for Weighing Thin Films and for Microweighing,

Corporate Author : GENERAL DYNAMICS/ASTRONAUTICS SAN DIEGO CA

Personal Author(s) : Sauerbrey, Guenter

Report Date : JUN 1962

Pagination or Media Count : 26

Abstract : If a quartz-resonator plate, excited to the thickness-shear vibration, is coated with a film of foreign material, the natural frequency of the plate will change because of the increased mass now oscillating. Since the frequency changes of a quartz resonator can be measured very accurately, this offers a very accurate method for weighing thin films.

Descriptors :   (*QUARTZ RESONATORS, MICROANALYSIS), (*FILMS, WEIGHT), FREQUENCY SHIFT, THICKNESS, BALANCES, CRYSTAL OSCILLATORS, MEASURING INSTRUMENTS, WEST GERMANY.

Subject Categories : Physical Chemistry
      Test Facilities, Equipment and Methods

Distribution Statement : APPROVED FOR PUBLIC RELEASE