Accession Number : AD0858369

Title :   Procedural Guidelines for the Reliability Assessment of Large-Scale Integrated Circuits.

Descriptive Note : Final technical rept. 2 Jan 68-1 May 69,

Corporate Author : PHILCO-FORD CORP BLUE BELL PA MICROELECTRONICS DIV

Personal Author(s) : Schnable, George ; Keen, Ralph S. ; Schlacter, Michael M. ; Lathlaen, Richard A. ; Schlegel, Earl S.

Report Date : AUG 1969

Pagination or Media Count : 271

Abstract : A study and investigation was performed to develop procedural guidelines for predicting and assessing the reliability of electronic equipment and systems using large-scale integrated (LSI) circuit arrays. The program included an analytical study of available published information, supplemented by experimental studies of multilevel metallized structures and LSI arrays. An extensive bibliography, containing over 450 references, was compiled. The analytical studies performed included a determination and detailed consideration of the factors that affect the reliability of LSI arrays, including important reliability-related factors in the fabrication processes. Consideration was given to reliability screening, electrical acceptance testing of finished LSI arrays, and system considerations. (Author)

Descriptors :   (*INTEGRATED CIRCUITS, RELIABILITY(ELECTRONICS)), FAILURE(ELECTRONICS), BIBLIOGRAPHIES, MANUFACTURING, TEST METHODS, PREDICTIONS, STANDARDS, QUALITY CONTROL.

Subject Categories : Electrical and Electronic Equipment

Distribution Statement : APPROVED FOR PUBLIC RELEASE