Accession Number : AD0860329

Title :   Reliability Characterization and Prediction of Integrated Circuits.

Descriptive Note : Interim technical rept. 20 Sep 68-20 Mar 69,

Corporate Author : BOEING AEROSPACE CO SEATTLE WA

Personal Author(s) : Porter, David C. ; Finke, Warren A.

Report Date : MAY 1969

Pagination or Media Count : 74

Abstract : The objective of the program is to develop analytical techniques for reliability characterization and prediction of integrated circuits for use by USAF project engineers and contractors in reliability design and evaluation of USAF microelectronic equipments. To accomplish the objective a comprehensive study will be made of principal factors that influence the failure rate of integrated quality control, screening, application, and cost. (Author)

Descriptors :   (*INTEGRATED CIRCUITS, RELIABILITY(ELECTRONICS)), FAILURE(ELECTRONICS), PREDICTIONS, TEST METHODS, STRESSES.

Subject Categories : Electrical and Electronic Equipment

Distribution Statement : APPROVED FOR PUBLIC RELEASE